Review Of CAE/Test Correlation And Prediction Level Based On Data
This paper was authored by D. H. Kang, C. U. Kim in support of their presentation at the 2015 NAFEMS World Congress that was held in San Diego, USA on 21-24th June 2015.
|Date ||21st June 2015|
|Order Ref||NWC15_220 Download|
|Member Price|| £0.00 | $0.01 | €0.01 |
|Non-member Price || £5.00 | $6.22 | €5.54 |
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