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Review Of CAE/Test Correlation And Prediction Level Based On Data

This paper was authored by D. H. Kang, C. U. Kim in support of their presentation at the 2015 NAFEMS World Congress that was held in San Diego, USA on 21-24th June 2015.

Document Details

ReferenceNWC15_220
AuthorsKang. D Kim. C
LanguageEnglish
TypePaper
Date 21st June 2015
OrganisationHyundai Motor Company
RegionGlobal

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